Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters-Reference-Cited by-同舟云学术

Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters

Published:2012-06-05 Issue:1 Volume:45 Page:163-166
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Mouhib T.,Poleunis C.¹,Möllers R.²,Niehuis E.²,Defrance P.³,Bertrand P.¹,Delcorte A.¹

Affiliation:

1. Bio and Soft Matter Division, Institute of Condensed Matter and Nanosciences; Université Catholique de Louvain; Croix du Sud 1, bte L7.04.01 Boltzmann; B-1348; Louvain-la-Neuve; Belgium

2. ION-TOF GmbH; Heisenbergstrasse 15; 48149; Muenster; Germany

3. Nanoscopic Physics Division, Institute of Condensed Matter and Nanosciences; Université Catholique de Louvain; Chemin du Cyclotron 2, bte L7.01.07; B-1348; Louvain-la-Neuve; Belgium

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference19 articles.

1. Cluster secondary ion mass spectrometry of polymers and related materials

2. O. Brox S. Hellweg A. Benninghoven Proc 12th Int Conf Secondary Ion Mass Spectrometry 2000

3. Depth profiling of polymer samples using Ga+ and C60 + ion beams

4. C60 molecular depth profiling of bilayered polymer films using ToF-SIMS

5. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

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