Quantitative AES: Determination of the effects of the relative orientations of the sample, electron gun and spectrometer on the direct spectrum shape for the establishment of standard reference spectra-Reference-Cited by-同舟云学术

Quantitative AES: Determination of the effects of the relative orientations of the sample, electron gun and spectrometer on the direct spectrum shape for the establishment of standard reference spectra

Published:1989-12 Issue:12 Volume:14 Page:823-834
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Smith G. C.,Seah M. P.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference39 articles.

1. and Handbook of Auger Electron Spectroscopy, 2nd Edn. Physical Electronics Industries Inc., Minnesota (1976).

2. Quantitative Surface Analysis of Materials, STP 643, p. 5. ASTM, Philadelphia, PA (1978).

3. Auger Electron Spectroscopy Reference Manual, Plenum Press, New York (1979).

4. Matrix effects in quantitative auger analysis of dilute alloys

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