Quantifying the effect of fracture surface topography on the scattering of grain boundary segregation measurement by Auger electron spectroscopy-Reference-Cited by-同舟云学术

Quantifying the effect of fracture surface topography on the scattering of grain boundary segregation measurement by Auger electron spectroscopy

Published:2010-01 Issue:1 Volume:61 Page:73-84
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Christien F.,Borjon-Piron Y.,Le Gall R.,Saillet S.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference19 articles.

1. AES in metallurgy;Seah,1990

2. Quantification of AES and XPS;Seah,1990

3. Davis LE, MacDonald NC, Palmberg PW, Riach GE, Weber RE. Handbook of Auger electron spectroscopy, second ed., Physical Electronics Division, Perkin-Elmer Corporation.

4. Intensity variations in Auger spectra caused by diffraction;Chang;Appl Phys Lett,1977

5. Electron channelling induced effects in grain boundary AES measurements;Bennett;Surf Interface Anal,1986

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