Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon-Reference-Cited by-同舟云学术

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Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon

Published:1992-06 Issue:1-12 Volume:19 Page:161-164
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Gunter P. L. J.,De Jong A. M.,Niemantsverdriet J. W.,Rheiter H. J. H.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference14 articles.

1. and J. Vac. Sci. Technol. A in press.

2. Basic assumptions and recent developments in quantitative XPS

3. ESCA studies of naturally passivated metal foils

4. An ESCA method for determining the oxide thickness on aluminum alloys

5. Surface characterization of aluminum foil annealed in the presence of ammonium fluoborate

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