Secondary ion mass spectrometry-basic concepts, instrumental aspects, applications and trends. A. BENNINGHOVEN, F. G. RUDENAUER and H. W. WERNER, Wiley, New York, 1987, 1277 pages-Reference-Cited by-同舟云学术

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Secondary ion mass spectrometry-basic concepts, instrumental aspects, applications and trends. A. BENNINGHOVEN, F. G. RUDENAUER and H. W. WERNER, Wiley, New York, 1987, 1277 pages

Published:1987-10 Issue:8 Volume:10 Page:435-435
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Vickerman J. C.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

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