Multivariate Calibration of ToF-SIMS and XPS Data from Plasma-Treated Polypropylene Thin Films
Author:
Affiliation:
1. Center for Materials and Microsystems; PAM-SE; Fondazione Bruno Kessler Trento Italy
Publisher
Wiley
Subject
Polymers and Plastics,Condensed Matter Physics
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/ppap.201300143/fullpdf
Reference22 articles.
1. Maximizing information obtained from secondary ion mass spectra of organic thin films using multivariate analysis
2. Information from complexity: Challenges of TOF-SIMS data interpretation
3. ToF-SIMS characterisation of ultra-thin fluorinated carbon plasma polymer films
4. Determination of oligomeric chain length distributions at surfaces using ToF-SIMS: segregation effects and polymer properties
5. Poly-dimethyl-siloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS) results
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