Author:
Oran U,Ünveren E,Wirth T,Unger W.E.S
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference19 articles.
1. E. Niehuis, in: A. Benninghoven, K.T.F. Janssen, J. Tümpner, H.W. Werner, Secondary Ion Mass Spectrometry (SIMS VIII), Wiley, 1990, p. 269.
2. Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation
3. Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications
4. J.C. Vickerman, D. Briggs, TOF-SIMS Surface Analysis by Mass Spectrometry, first ed., IM publications, UK and Surface Spectra Limited, 2001 (chapter 5).
5. Surface studies by static secondary ion mass spectrometry: cluster ion formation studied by tandem mass-spectrometric techniques
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