Determination of the real transmission of an x-ray lens for micro-focus XRF at the SEM by coupling measurement with calculation of scatter spectra
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference27 articles.
1. A new microfocus x-ray source, iMOXS, for highly sensitive XRF analysis in scanning electron microscopes
2. Integrated Electron and X-Ray Induced Microbeam XRF in the SEM
3. Micro-XRF excitation in an SEM
4. X-ray fluorescence as an additional analytical method for a scanning electron microscope
5. Channeling of photons and new X-ray optics
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