Analysis of elemental composition of Fe 1‐x Ni x and Si 1‐x Ge x alloy thin films by electron probe microanalysis and micro‐focus X‐ray fluorescence-Reference-Cited by-同舟云学术

Analysis of elemental composition of Fe 1‐x Ni x and Si 1‐x Ge x alloy thin films by electron probe microanalysis and micro‐focus X‐ray fluorescence

Author:

Hodoroaba Vasile‐Dan¹^ORCID,Terborg Ralf²,Boehm Stephan²,Kim Kyung Joong³^ORCID

Affiliation:

1. Division 6.1 Surface Analysis and Interfacial Chemistry Federal Institute for Materials Research and Testing (BAM) Berlin Germany

2. Bruker Nano GmbH Berlin Germany

3. Division of Industrial Metrology Korea Research Institute of Standards and Science (KRISS) Daejeon South Korea

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

Reference16 articles.

3. Characterization of Pd‐Ni‐Co alloy thin films by ED‐EPMA with application of the STRATAGEM software;Kuehn J;Surf Interface Anal,2012

4. Stratagem Version 6.7 SAMx 1554 route de la Roquette 06670 Levens – France.

5. A new model for quantitative X‐ray microanalysis, part II: application to in‐analysis of heterogeneous samples;Pouchou JL;Rech Aerosp,1984

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献