Comparison of two parameter choice methods for the extraction of depth profiles by means of a regularized multipoint profile model from ARXPS data obtained on a three-component system-Reference-Cited by-同舟云学术

Comparison of two parameter choice methods for the extraction of depth profiles by means of a regularized multipoint profile model from ARXPS data obtained on a three-component system

Published:2009-07 Issue:7 Volume:41 Page:595-601
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Paynter R. W.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference25 articles.

1. Solid state—and surface—analysis by means oF angular-dependent x-ray photoelectron spectroscopy

2. Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

3. Reconstruction of the depth profile from angle-resolved AES/XPS

4. Simulation study on regeneration of depth profiles from angle-resolved XPS data

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