Improving Data Quality in Traditional Low‐Dose Scanning Transmission Electron Microscopy Imaging-Reference-Cited by-同舟云学术

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Improving Data Quality in Traditional Low‐Dose Scanning Transmission Electron Microscopy Imaging

Published:2022-11-14 Issue:1 Volume:40 Page:2200122
ISSN:0934-0866
Container-title:Particle & Particle Systems Characterization
language:en
Short-container-title:Part & Part Syst Charact

Author:

Wang Lingling¹,Jiang Yilan²³,Zhou Yi²³^ORCID,Shi Ruikai¹,Hosokawa Fumio⁴,Terasaki Osamu²³^ORCID,Zhang Qing²³^ORCID

Affiliation:

1. JEOL (Beijing) Co., Ltd. Shanghai Branch Shanghai 201210 China

2. School of Physical Science and Technology ShanghaiTech University Shanghai 201210 China

3. Shanghai Key Laboratory of High‐Resolution Electron Microscopy ShanghaiTech University Shanghai 201210 China

4. FH electron optics Kita, Kunitachi Tokyo 186‐0001 Japan

Funder

ShanghaiTech University

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/ppsc.202200122

Reference35 articles.

1. Electron Microscopy of Nanoporous Crystals

2. Imaging Beam‐Sensitive Materials by Electron Microscopy

3. High-resolution transmission electron microscopy of beam-sensitive halide perovskites

4. Electron crystallography for determining the handedness of a chiral zeolite nanocrystal

5. Direct Atomic‐Level Imaging of Zeolites: Oxygen, Sodium in Na‐LTA and Iron in Fe‐MFI

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electron beam damages in zeolites: A review;Microporous and Mesoporous Materials;2024-01

2. Precise Confinement and Position Distribution of Atomic Cu and Zn in ZSM-5 for CO2 Hydrogenation to Methanol;Nanomaterials;2023-11-29

3. Atomic-Level Imaging of Zeolite Local Structures Using Electron Ptychography;Journal of the American Chemical Society;2023-03-06

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