Impact of Interface Energetic Alignment and Mobile Ions on Charge Carrier Accumulation and Extraction in p‐i‐n Perovskite Solar Cells

Author:

Xu Weidong1ORCID,Hart Lucy J. F.12ORCID,Moss Benjamin1,Caprioglio Pietro3,Macdonald Thomas J.14,Furlan Francesco1,Panidi Julianna1,Oliver Robert D. J.35,Pacalaj Richard A.12,Heeney Martin1,Gasparini Nicola1,Snaith Henry J.3,Barnes Piers R. F.2,Durrant James R.16ORCID

Affiliation:

1. Department of Chemistry and Centre for Processable Electronics Imperial College London W12 0BZ UK

2. Department of Physics and Centre for Processable Electronics Imperial College London SW7 2AZ UK

3. Department of Physics University of Oxford Clarendon Laboratory Parks Road Oxford OX1 3PU UK

4. School of Engineering and Materials Science Queen Mary University of London London E1 4NS UK

5. Department of Physics and Astronomy University of Sheffield Hounsfield Road Sheffield S3 7RH UK

6. SPECIFIC IKC College of Engineering Swansea University Bay Campus, Fabian Way Swansea Wales SA1 8EN UK

Abstract

AbstractUnderstanding the kinetic competition between charge extraction and recombination, and how this is impacted by mobile ions, remains a key challenge in perovskite solar cells (PSCs). Here, this issue is addressed by combining operando photoluminescence (PL) measurements, which allow the measurement of real‐time PL spectra during current–voltage (J–V) scans under 1‐sun equivalent illumination, with the results of drift‐diffusion simulations. This operando PL analysis allows direct comparison between the internal performance (recombination currents and quasi‐Fermi‐level‐splitting (QFLS)) and the external performance (J–V) of a PSC during operation. Analyses of four PSCs with different electron transport materials (ETMs) quantify how a deeper ETM LUMO induces greater interfacial recombination, while a shallower LUMO impedes charge extraction. Furthermore, it is found that a low ETM mobility leads to charge accumulation in the perovskite under short‐circuit conditions. However, thisalone cannot explain the remarkably high short‐circuit QFLS of over 1 eV which is observed in all devices. Instead, drift‐diffusion simulations allow this effect to be assigned to the presence of mobile ions which screen the internal electric field at short‐circuit and lead to a reduction in the short‐circuit current density by over 2 mA cm−2 in the best device.

Funder

Engineering and Physical Sciences Research Council

Royal Commission for the Exhibition of 1851

Publisher

Wiley

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3