LO-TO Mode Splittings and Dynamic Effective Charges of Oxygen in Reactively Sputtered SiOx Determined by IR Spectroscopy
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Infrared Studies of Reactively Sputtered SiOx Films in the Composition Range 0.2 ≦ x ≦ 1.9
2. Infrared Absorption at Longitudinal Optic Frequency in Cubic Crystal Films
3. Detection of LO and TO Phonons in Amorphous SiO2 Films by Oblique Incidence of IR Light
4. , and , to be published.
5. Chemical bond and related properties of SiO2. VII. Structure and electronic properties of the SiOx region of Si–SiO2 interfaces
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1. The effect of atmospheric annealing on the photoluminescence of sandwich-structured thin films of silicon nanoparticles embedded in Al2O3matrices;Journal of Physics: Condensed Matter;2001-02-07
2. Oscillations in the derivatives of broad structureless absorption spectra of silicon nanocolloids;Journal of Physics: Condensed Matter;1999-10-15
3. Determination of Stoichiometry and Oxygen Content in Platelike and Octahedral Oxygen Precipitates in Silicon with FT-IR Spectroscopy;Materials Science Forum;1997-12
4. Infrared reflectance spectroscopy of porous silicas;Colloids and Surfaces A: Physicochemical and Engineering Aspects;1993-07
5. IR spectra of SiO2 films deposited from the gas phase;Journal of Applied Spectroscopy;1991-08
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