Dielectric Constant in ZnxHg1–xSe Determined by Raman Scattering
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Far infrared reflection spectra due to lattice and free carrier in ZnxHg1−xSe
2. Resonant Raman Scattering in ZnxHg1–xSe
3. Interband critical point parameters determined by ellipsometry in ZnxHg1−xSe
4. Resonant Raman Scattering near E1 + Δ1 in CdxHg1−xSe
5. in: Light Scattering in Solids, Vol. 2, Ed. and , Springer-Verlag, Berlin 1982, (p. 19).
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