Characterization of GaSb Epitaxial Layers on GaSb and GaAs Substrates by Infrared Reflectivity
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference6 articles.
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2. Optical Determination of Carrier Concentration and Mobility in p and n Bulk GaSb by Infrared Reflectivity Spectral Analysis
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4. An Algorithm for Least-Squares Estimation of Nonlinear Parameters
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4. Infrared reflectance study of n-type GaSb epitaxial layers;Solid State Communications;1997-12
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