Refined RBS and AES techniques for the analysis of thin films used in photovoltaic devices

Author:

Bohne W.,Fenske F.,Kelling S.,Schöpke A.,Selle B.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Survey of Semiconductor Physics, Van Nostrand/Reinhold Co., New York 1992.

2. Materials for Solar Photovoltaic Energy Conversion

3. Thin-film solar cells

4. , and , Backscattering Spectrometry, Academic Press, New York 1978.

5. and , Practical Surface Analysis, John Wiley & Sons, Chichester 1985.

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Physical characterization of thin-film solar cells;Progress in Photovoltaics: Research and Applications;2004-03

2. Spatially resolved surface spectroscopy;Stress and Strain in Epitaxy;2001

3. Surface Analysis:  X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy;Analytical Chemistry;1998-05-01

4. Characterization of the stoichiometry of coevaporated FeSi x films by AES, EDX, RBS, and electron microscopy;Fresenius' Journal of Analytical Chemistry;1997-05-21

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