Misfit Dislocation Guided Topographic and Conduction Patterning in Complex Oxide Epitaxial Thin Films-Reference-Cited by-同舟云学术

Misfit Dislocation Guided Topographic and Conduction Patterning in Complex Oxide Epitaxial Thin Films

Published:2016-04-13 Issue:14 Volume:3 Page:1600106
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Sandiumenge Felip¹,Bagués Núria¹²,Santiso José²,Paradinas Markos¹²,Pomar Alberto¹,Konstantinovic Zorica³,Ocal Carmen¹,Balcells Lluís¹,Casanove Marie-Jo⁴,Martínez Benjamín¹

Affiliation:

1. ICMAB-CSIC; Campus de la UAB; 08193 Bellaterra Spain

2. CIN2 (CSIC-ICN); Campus de la UAB; 08193 Bellaterra Spain

3. Center for Solid State Physics and New Materials; Institute of Physics Belgrade; University of Belgrade; Pregrevica 118 11080 Belgrade Serbia

4. CNRS; CEMES; Universite de Toulouse UPS; 29 Rue J. Marvig Toulouse 31055 France

Funder

Seventh Framework Programme

FPI program

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Reference54 articles.

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4. Metallic and Insulating Oxide Interfaces Controlled by Electronic Correlations

5. Quantifying strain dependence in “colossal” magnetoresistance manganites

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