Metallic and Insulating Oxide Interfaces Controlled by Electronic Correlations-Reference-Cited by-同舟云学术

Metallic and Insulating Oxide Interfaces Controlled by Electronic Correlations

Published:2011-02-18 Issue:6019 Volume:331 Page:886-889
ISSN:0036-8075
Container-title:Science
language:en
Short-container-title:Science

Author:

Jang H. W.¹,Felker D. A.²,Bark C. W.¹,Wang Y.³,Niranjan M. K.³,Nelson C. T.⁴,Zhang Y.⁴⁵,Su D.⁶,Folkman C. M.¹,Baek S. H.¹,Lee S.¹,Janicka K.³,Zhu Y.⁶,Pan X. Q.⁴,Fong D. D.⁷,Tsymbal E. Y.³,Rzchowski M. S.²,Eom C. B.¹

Affiliation:

1. Department of Materials Science and Engineering, University of Wisconsin–Madison, Madison, WI 53706, USA.

2. Department of Physics, University of Wisconsin–Madison, Madison, WI 53706, USA.

3. Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska–Lincoln, Lincoln, NE 68588, USA.

4. Department of Materials Science and Engineering, University of Michigan–Ann Arbor, Ann Arbor, MI 48109, USA.

5. National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, P.R. China.

6. Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973, USA.

7. Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.

Abstract

The strength of electronic correlations dictates the transport properties of oxide interfaces.

Funder

Office of Basic Energy Sciences

National Science Foundation

Center for Functional Nanomaterials

U.S. Department of Energy

Publisher

American Association for the Advancement of Science (AAAS)

Subject