Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis-Reference-Cited by-同舟云学术

Optimal designs of constant‐stress accelerated life‐tests for one‐shot devices with model misspecification analysis

Published:2021-12-03 Issue:2 Volume:38 Page:989-1012
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Quality & Reliability Eng

Author:

Balakrishnan Narayanaswamy¹^ORCID,Castilla Elena²^ORCID,Ling Man Ho³^ORCID

Affiliation:

1. Department of Mathematics and Statistics McMaster University Hamilton Ontario Canada

2. Department of Statistics and O.R. Complutense University of Madrid Madrid Spain

3. Department of Mathematics and Information and Technology The Education University of Hong Kong Hong Kong SAR China

Funder

Natural Sciences and Engineering Research Council of Canada

Ministerio de Ciencia, Innovación y Universidades

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/qre.3031

Reference38 articles.

1. OlwellDH SorellAA.Warranty calculations for missiles with only current‐status data using Bayesian methods. InAnnual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No. 01CH37179).IEEE;2001:133–138.

2. Monitoring and maintenance of spares and one shot devices

3. The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

4. Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress

5. Gamma lifetimes and one-shot device testing analysis

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