Scanning electron diffraction using the pnCCD (S)TEM Camera-Reference-Cited by-同舟云学术

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Scanning electron diffraction using the pnCCD (S)TEM Camera

Published:2016-12-20 Issue: Volume: Page:641-642
ISSN:
Container-title:European Microscopy Congress 2016: Proceedings
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Author:

Ritz Robert¹,Huth Martin¹,Ihle Sebastian¹,Schmidt Julia¹,Simson Martin¹,Soltau Heike¹,Johnstone Duncan N.²,Leary Rowan K.²,Midgley Paul A.²,Duchamp Martial³,Migunov Vadim³,Dunin-Borkowski Rafal E.³,Ryll Henning⁴,Strüder Lothar⁴

Affiliation:

1. PNDetector GmbH; Munich Allemagne

2. Department of Materials Science and Metallurgy; University of Cambridge; Cambridge Royaume Uni

3. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons; FZ Jülich; Jülich Allemagne

4. PNSensor GmbH; Munich Allemagne

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference4 articles.

1. Controlled charge extraction—antiblooming capabilities in pnCCD imaging sensors

2. High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes

3. A.J. Knowles et al Ti-2015, proceedings of the 13th World Conference on Titanium

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