Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers-Reference-Cited by-同舟云学术

Semi-quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers

Published:2015-06-05 Issue:12 Volume:23 Page:1857-1866
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog. Photovolt: Res. Appl.

Author:

Nuñez Neftali¹,Vazquez Manuel¹,Orlando Vincenzo¹,Espinet-González Pilar¹,Algora Carlos¹

Affiliation:

1. Instituto de Energía Solar; Universidad Politécnica de Madrid; Madrid 28040 Spain

Funder

European Commission

NEDO

MINECO

Comunidad de Madrid

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference28 articles.

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5. IEC 62108 - concentrator photovoltaic (CPV) modules and assemblies - design qualification and type approval 2007

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