Temperature Accelerated Life Test and Failure Analysis on Upright Metamorphic Ga 0.37 In 0.63 P/Ga 0.83 In 0.17 As/Ge Triple Junction Solar Cells

Author:

Orlando Vincenzo1ORCID,Lombardero Iván1ORCID,Gabás Mercedes2,Nuñez Neftali1,Vázquez Manuel1,Espinet‐González Pilar1,Bautista Jesús1,Romero Rocio2,Algora Carlos1ORCID

Affiliation:

1. Instituto de Energía Solar, Universidad Politécnica de Madrid Madrid 28040 Spain

2. Dept. Física Aplicada I, The Nanotech Unit, Universidad de Málaga Málaga 29071 Spain

Funder

Consejería de Educación, Juventud y Deporte, Comunidad de Madrid

FP7 Energy

Secretaría de Estado de Investigación, Desarrollo e Innovación

Universidad Politécnica de Madrid

Comunidad de Madrid

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Handbook of Concentrator Photovoltaic Technology

2. Temperature accelerated life test on commercial concentrator III-V triple-junction solar cells and reliability analysis as a function of the operating temperature

3. Failure analysis on lattice matched GaInP/Ga(In)As/Ge commercial concentrator solar cells after temperature accelerated life tests

4. EltermannF. WiesenfarthM. SieferG. WildeJ. BettA. FingerprintM. "The effects of accelerated aging tests on metamorphic III‐V concentrator solar cells mounted on substrates " inProceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition 2011 pp. 163‐168.https://doi.org/10.4229/26thEUPVSEC2011‐1BO.12.2

5. 40% efficient metamorphic GaInP∕GaInAs∕Ge multijunction solar cells

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