Numerical Simulation of Highly Sensitive Ga2O3 Pressure Sensor

Author:

Than Phuc Hong1ORCID,Dao Tuan Ngoc2,Takaki Yasushi3

Affiliation:

1. Faculty of Electrical & Electronics Engineering Duy Tan University (DTU) 3 Quang Trung, Hai Chau Dist. Da Nang 550000 Vietnam

2. School of Mechanical Engineering Ulsan National Institute of Science and Technology (UNIST) 50 UNIST-gil, Eonyang-eup, Ulju-gun Ulsan 44919 Korea

3. Power Device Works Mitsubishi Electric Corporation 997, Miyoshi, Koushi-shi Kumamoto 861-1197 Japan

Abstract

This article presents beta‐gallium oxide (β‐Ga2O3) micro electro mechanical systems (MEMS) strain/pressure sensors as a way to enhance sensitivity. The model consists of four piezoresistive strain gauges connected in a Wheatstone bridge configuration. The MEMS model is simulated from 0 Pa to 50 kPa, resulting in an output signal range of −3–16 mV and a responsivity of 0.38 mV kPa−1. The simulation also shows that as temperature increases, the resistance of the piezoresistive material in the MEMS decreases, leading to changes in the output signals. The reliable device effectively utilizes the full Wheatstone bridge configuration to compensate for temperature‐related influences. These early results suggest that Ga2O3‐based MEMS devices have great potential for use in high‐temperature pressure sensor applications in the future.

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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