Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide-Reference-Cited by-同舟云学术

Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide

Published:2021-12-07 Issue: Volume: Page:2100378
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:Phys. Status Solidi A

Author:

Jellison Gerald E.¹^ORCID,Hermann Raphaël P.²,Specht Elliot D.¹,Boatner Lynn A.¹,Zac Ward T.²,Herklotz Andreas³

Affiliation:

1. Oak Ridge National Laboratory Oak Ridge TN 37831 USA

2. Materials Science and Technology Division Oak Ridge National Laboratory Oak Ridge TN 37831 USA

3. Institute of Physics Martin-Luther-University Halle-Wittenberg 06120 Halle Germany

Funder

Basic Energy Sciences

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.202100378

Reference25 articles.

1. Temperature Dependence of the Fundamental Optical Absorption Edge in Stannic Oxide

2. Tin dioxide from first principles: Quasiparticle electronic states and optical properties

3. Ordinary and extraordinary dielectric functions of rutile SnO2 up to 20 eV

4. Anisotropic optical properties of highly doped rutile SnO2: Valence band contributions to the Burstein-Moss shift

5. Growth of SnO2 single crystals by a vapour phase reaction method

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1. Optical functions of uniaxial rutile and anatase (TiO2) revisited;Surface Science Spectra;2024-07-15

2. Ellipsometry: dielectric functions of anisotropic crystals and symmetry;Journal of the Optical Society of America A;2022-11-14