Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer-Reference-Cited by-同舟云学术

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Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer

Published:2016-09-16 Issue:20 Volume:30 Page:2279-2284
ISSN:0951-4198
Container-title:Rapid Communications in Mass Spectrometry
language:en
Short-container-title:Rapid Commun. Mass Spectrom.

Author:

Ninomiya Satoshi¹,Sakai Yuji²,Watanabe Ryo¹,Sogou Mauo³,Miyayama Takuya³,Sakai Daisuke³,Watanabe Katsumi³,Chen Lee Chuin¹,Hiraoka Kenzo²

Affiliation:

1. Interdisciplinary Graduate School; University of Yamanashi; 4-3-11 Takeda, Kofu Yamanashi 400-8511 Japan

2. Clean Energy Research Center; University of Yamanashi; 4-3-11 Takeda, Kofu Yamanashi 400-8511 Japan

3. ULVAC-PHI Inc.; 370 Enzo Chigasaki Kanagawa 253-8522 Japan

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Reference30 articles.

1. A C60 primary ion beam system for time of flight secondary ion mass spectrometry: Its development and secondary ion yield characteristics;Weibel;Anal. Chem.,2003

2. Tissue molecular ion imaging by gold cluster ion bombardment;Touboul;Anal. Chem.,2004

3. Cluster primary ion bombardment of organic materials;Kollmer;Appl. Surf. Sci.,2004

4. The magic of cluster SIMS;Winograd;Anal. Chem.,2005

5. Imaging of membrane lipids in single cells by imprint-imaging time-of-flight secondary ion mass spectrometry;Sjövall;Anal. Chem.,2003

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1. Generation of Water Droplet Ion Beam for ToF-SIMS Analysis;MASS SPECTROM LETT;2024

2. Sputtering produced by vacuum electrospray droplet ions with different sizes and charges;Journal of Vacuum Science & Technology B;2023-04-28

3. Current Status of a Vacuum Electrospray Droplet Ion Beam and towards TOF-SIMS Applications;Journal of Surface Analysis;2021

4. Bismuth adducted intact molecular ions [M + Bi]+ under low-energy bismuth cluster ion beams;Journal of Vacuum Science & Technology B;2020-05

5. Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate;Rapid Communications in Mass Spectrometry;2018-09-23

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