Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate-Reference-Cited by-同舟云学术

Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate

Published:2018-09-23 Issue:21 Volume:32 Page:1867-1874
ISSN:0951-4198
Container-title:Rapid Communications in Mass Spectrometry
language:en
Short-container-title:Rapid Commun Mass Spectrom

Author:

Fujiwara Yukio¹^ORCID,Saito Naoaki¹

Affiliation:

1. National Metrology Institute of Japan (NMIJ); National Institute of Advanced Industrial Science and Technology (AIST); Tsukuba Central 2, 1-1-1 Umezono Tsukuba-shi Ibaraki-ken 305-8568 Japan

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/rcm.8256/fullpdf

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5. Cluster secondary ion mass spectrometry of polymers and related materials;Mahoney;Mass Spectrom Rev,2010

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