Theory and application of Kossel x-ray diffraction in the scanning electron microscope
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Reference53 articles.
1. The accurate determination of lattice parameters and crystal orientations from Kossel patterns;Bevis;Phys. stat. sol. (a),1970
2. The determination of the orientation of micro-crystals using a back-reflection Kossel technique and an electron probe microanalyser;Bevis;Phys. Stat. Sol.,1967
3. X-ray diffraction from micro-crystals in scanning electron beam instruments;Bevis;J. Mat. Sci.,1973
4. A general method for locating the x-ray source point in Kossel diffraction;Biggin;J. Appl. Cryst.,1977
5. Some comments on the interpretation of the Kikuchi-like reflection patterns observed by scanning electron microscopy;Booker;Phil. Mag.,1967
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1. Synthesizing pseudo-Kossel lines from neutron transmission data. II. Validation with neutron diffraction data;Journal of Applied Crystallography;2023-03-30
2. Synthesizing pseudo-Kossel lines from neutron transmission data. I. An analytical approach for recovering single-crystal orientation;Journal of Applied Crystallography;2023-03-30
3. EBSD orientation analysis based on experimental Kikuchi reference patterns;Acta Materialia;2020-04
4. Model mechanisms in Kikuchi pattern formation from crystals;Crystal Research and Technology;2017-03-28
5. Stress Analysis by Kossel Microdiffraction on a Nickel-Based Single Crystal Superalloy during an In Situ Tensile Test – Comparison with Classical X-Ray Diffraction;Materials Science Forum;2011-03
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