X-ray diffraction from micro-crystals in scanning electron beam instruments-Reference-Cited by-同舟云学术

X-ray diffraction from micro-crystals in scanning electron beam instruments

Published:1973-06 Issue:6 Volume:8 Page:898-900
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Bevis M.,Swindells N.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF02397921.pdf

Reference12 articles.

1. P. C. Rowlands, E. O. Fearon, andM. Bevis,J. Mater. Sci. 5 (1970) 769.

2. M. Umeno andG. Shinoda,ibid 3 (1968) 120.

3. N. Swindells andJ. Burke, “The Mechanism of Phase Transformations in Crystalline Solids” (Institute of Metals, London, 1969) p. 92.

4. D. L. Vieth andH. Yakowitz,Rev. Sci. Instrum. 39 (1968) 1929.

5. H. Hälbig, P. L. Ryder, andW. Pitsch, “X-ray Optics and Microanalysis”, Proc. 5th Inst. Congress, Tubingen 1968 (Springer-Verlag, Berlin, 1969) p. 388.

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1. Theory and application of Kossel x-ray diffraction in the scanning electron microscope;Scanning;1978

2. The anisotropy of the deformation twinning behaviour of iron-nickel martensite crystals possessing a transformation twin microstructure;Proceedings of the Royal Society of London. A. Mathematical and Physical Sciences;1977-04-21

3. A Kossel camera designed for the cameca electron probe microanalyser;Journal of Applied Crystallography;1975-04-01

4. Grain boundaries in recrystallization;Canadian Metallurgical Quarterly;1974-01