Measurement of specimen charging in scanning electron microscopy with a kelvin probe
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Reference8 articles.
1. SEM investigation of semiconductors by the capacitive techniques;Aristov;Microelectr Eng,1990
2. Space-charge distribution on electron-beam charged dielectrics;Arkhipov;J Phys D,1991
3. Charge trap spectroscopy in single and multiple layer dielectrics;Fitting;Phys Stat Sol (a),1990
4. Charging effect in scanning electron microscopy;Ichinokawa;Jpn J Appl Phys,1974
5. Contact electricity of metals;Lord;Phil Mag,1898
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