Image sharpness measurement in the scanning electron microscope-Part III-Reference-Cited by-同舟云学术

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Image sharpness measurement in the scanning electron microscope-Part III

Published:2006-12-06 Issue:4 Volume:21 Page:246-252
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Zhang Nien Fan,Postek Michael T.,Larrabee Robert D.,Vladár András E.,Keery William J.,Jones Samuel N.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference13 articles.

1. Dodson TA Joy DC Fast Fourier transform techniques for measuring SEM resolution Proc. XIIth Int. Congress for EM 406 407 1990

2. A note on kurtosis;Finucan;J Royal Stat Soc,1964

3. A common error concerning kurtosis;Kaplansky;J Am Stat Assoc,1945

4. Kotz S Johnson NL Encyclopedia of Statistical Sciences 425 426 1982

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