Calculation and comparison of the surface ionization ϕ(0)-Reference-Cited by-同舟云学术

Calculation and comparison of the surface ionization ϕ(0)

Published:1990-01 Issue:1 Volume:12 Page:14-22
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

August H-J.,Wernisch J.

Funder

Austrian Fonds zur Förderung der wissenschaftlichen Forschung

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950120104/fullpdf

Reference48 articles.

1. August H-J Optimierung der Methoden zur Untersuchung dünner Schichten mit Hilfe der Elektronenstrahlmikroanalyse (ESMA) 1988

2. August H-J Wernisch J Der Rückstreufaktor als Teil der Korrekturverfahren in der quantitativen Elektronenstrahlmikroanalyse (The backscattering factor as a part of the correction procedures employed in quantitative electron probe microanalysis) Radex-Rundschau 624 637 1988

3. Analytical expressions for the electron backscattering coefficient;August;Phys Stat Sol (A),1989a

4. August H-J Wernisch J Theoretical prediction of the electron backscattering coefficient for multilayer structures J Microsc 1989b

5. Calculation and comparison of the backscattering factor R for characteristic x-ray emission;August;Scanning,1988

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2. Second Generation of Correction Methods in Electron Probe X-ray Microanalysis: Approximation Models for Emission Depth Distribution Functions;Journal of Analytical Chemistry;2004-07

3. An experimental approach to the determination of the surface ionization ?(0) in electron probe microanalysis;X-Ray Spectrometry;2001

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