Charge Carrier Induced Structural Ordering And Disordering in Organic Mixed Ionic Electronic Conductors

Author:

Quill Tyler J.1ORCID,LeCroy Garrett1ORCID,Marks Adam1,Hesse Sarah A.2,Thiburce Quentin1,McCulloch Iain3,Tassone Christopher J.2,Takacs Christopher J.2,Giovannitti Alexander14,Salleo Alberto1ORCID

Affiliation:

1. Department of Materials Science and Engineering Stanford University Stanford CA 94305 USA

2. Stanford Synchrotron Radiation Lightsource SLAC National Accelerator Laboratory Menlo Park CA 94025 USA

3. Department of Chemistry University of Oxford Oxford OX1 3TA UK

4. Department of Chemistry and Chemical Engineering Chalmers University of Technology Göteborg SE‐412 96 Sweden

Abstract

AbstractOperational stability underpins the successful application of organic mixed ionic‐electronic conductors (OMIECs) in a wide range of fields, including biosensing, neuromorphic computing, and wearable electronics. In this work, both the operation and stability of a p‐type OMIEC material of various molecular weights are investigated. Electrochemical transistor measurements reveal that device operation is very stable for at least 300 charging/discharging cycles independent of molecular weight, provided the charge density is kept below the threshold where strong charge–charge interactions become likely. When electrochemically charged to higher charge densities, an increase in device hysteresis and a decrease in conductivity due to a drop in the hole mobility arising from long‐range microstructural disruptions are observed. By employing operando X‐ray scattering techniques, two regimes of polaron‐induced structural changes are found: 1) polaron‐induced structural ordering at low carrier densities, and 2) irreversible structural disordering that disrupts charge transport at high carrier densities, where charge–charge interactions are significant. These operando measurements also reveal that the transfer curve hysteresis at high carrier densities is accompanied by an analogous structural hysteresis, providing a microstructural basis for such instabilities. This work provides a mechanistic understanding of the structural dynamics and material instabilities of OMIEC materials during device operation.

Funder

U.S. Department of Energy

Office of Science

Oak Ridge Institute for Science and Education

National Science Foundation

SLAC National Accelerator Laboratory

King Abdullah University of Science and Technology

Office of Research and Sponsored Programs, Marquette University

Engineering and Physical Sciences Research Council

Stanford University

Horizon 2020

Semiconductor Research Corporation

Basic Energy Sciences

Workforce Development for Teachers and Scientists

Publisher

Wiley

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3