Affiliation:
1. Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37830 USA
Abstract
AbstractThe scanning transmission electron microscope, a workhorse instrument in materials characterization, is being transformed into an atomic‐scale material‐manipulation platform. With an eye on the trajectory of recent developments and the obstacles toward progress in this field, a vision for a path toward an expanded set of capabilities and applications is provided. The microscope is reconceptualized as an instrument for fabrication and synthesis with the capability to image and characterize atomic‐scale structural formation as it occurs. Further development and refinement of this approach may have substantial impact on research in microelectronics, quantum information science, and catalysis, where precise control over atomic‐scale structure and chemistry of a few “active sites” can have a dramatic impact on larger‐scale functionality and where developing a better understanding of atomic‐scale processes can help point the way to larger‐scale synthesis approaches.
Funder
U.S. Department of Energy
Office of Science
Basic Energy Sciences
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Cited by
3 articles.
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