Decoupled High‐Mobility Graphene on Cu(111)/Sapphire via Chemical Vapor Deposition

Author:

Gebeyehu Zewdu M.12,Mišeikis Vaidotas12,Forti Stiven12,Rossi Antonio12ORCID,Mishra Neeraj12,Boschi Alex12,Ivanov Yurii P.3,Martini Leonardo12,Ochapski Michal W.12,Piccinini Giulia145,Watanabe Kenji6,Taniguchi Takashi7,Divitini Giorgio3,Beltram Fabio4,Pezzini Sergio4,Coletti Camilla12ORCID

Affiliation:

1. Center for Nanotechnology Innovation @NEST Istituto Italiano di Tecnologia Piazza San Silvestro 12 Pisa 56127 Italy

2. Graphene Labs Istituto Italiano di Tecnologia Via Morego 30 Genova 16163 Italy

3. Electron Spectroscopy and Nanoscopy Istituto Italiano di Tecnologia Via Morego 30 Genova 16163 Italy

4. NEST Istituto Nanoscienze‐CNR and Scuola Normale Superiore Pisa 56127 Italy

5. ICFO‐Institut de Ciències Fotòniques The Barcelona Institute of Science and Technology Av. Carl Friedrich Gauss 3, Castelldefels Barcelona 08860 Spain

6. Research Center for Electronic and Optical Materials National Institute for Materials Science 1‐1 Namiki Tsukuba 305‐0044 Japan

7. Research Center for Materials Nanoarchitectonics National Institute for Materials Science 1‐1 Namiki Tsukuba 305‐0044 Japan

Abstract

AbstractThe growth of high‐quality graphene on flat and rigid templates, such as metal thin films on insulating wafers, is regarded as a key enabler for technologies based on 2D materials. In this work, the growth of decoupled graphene is introduced via non‐reducing low‐pressure chemical vapor deposition (LPCVD) on crystalline Cu(111) films deposited on sapphire. The resulting film is atomically flat, with no detectable cracks or ripples, and lies atop of a thin Cu2O layer, as confirmed by microscopy, diffraction, and spectroscopy analyses. Post‐growth treatment of the partially decoupled graphene enables full and uniform oxidation of the interface, greatly simplifying subsequent transfer processes, particularly dry‐pick up — a task that proves challenging when dealing with graphene directly synthesized on metallic Cu(111). Electrical transport measurements reveal high carrier mobility at room temperature, exceeding 104 cm2 V−1 s−1 on SiO2/Si and 105 cm2 V−1 s−1 upon encapsulation in hexagonal boron nitride (hBN). The demonstrated growth approach yields exceptional material quality, in line with micro‐mechanically exfoliated graphene flakes, and thus paves the way toward large‐scale production of pristine graphene suitable for high‐performance next‐generation applications.

Publisher

Wiley

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