Robust Piezoelectricity with Spontaneous Polarization in Monolayer Tellurene and Multilayer Tellurium Film at Room Temperature for Reliable Memory-Reference-Cited by-同舟云学术

Robust Piezoelectricity with Spontaneous Polarization in Monolayer Tellurene and Multilayer Tellurium Film at Room Temperature for Reliable Memory

Published:2022-08-03 Issue:35 Volume:34 Page:2204697
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Advanced Materials

Author:

Rao Gaofeng¹,Fang Hui²,Zhou Ting¹,Zhao Chunlin³⁴,Shang Nianze⁵,Huang Jianwen¹^ORCID,Liu Yuqing¹,Du Xinchuan¹,Li Peng¹,Jian Xian¹,Ma Liang²,Wang Jinlan²,Liu Kaihui⁵,Wu Jiagang³,Wang Xianfu¹,Xiong Jie¹

Affiliation:

1. State Key Laboratory of Electronic Thin Film and Integrated Devices University of Electronic Science and Technology of China Chengdu 611731 China

2. School of Physics Southeast University Nanjing 211189 China

3. Department of Materials Science Sichuan University Chengdu 6110064 China

4. College of Materials Science and Engineering Fuzhou University Fuzhou 350108 China

5. State Key Laboratory for Mesoscopic Physics Frontiers Science Center for Nano‐optoelectronics School of Physics Academy for Advanced Interdisciplinary Studies Peking University Beijing 100871 China

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

China Postdoctoral Science Foundation

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.202204697

Reference59 articles.