Cluster secondary ion emission of silicon: An influence of the samples' dimensional features-Reference-Cited by-同舟云学术

Cluster secondary ion emission of silicon: An influence of the samples' dimensional features

Published:2019-01-10 Issue:3 Volume:33 Page:323-325
ISSN:0951-4198
Container-title:Rapid Communications in Mass Spectrometry
language:en
Short-container-title:Rapid Commun Mass Spectrom

Author:

Tolstogouzov Alexander¹²³^ORCID,Drozdov Mikhail N.⁴,Belykh Sergey F.³,Gololobov Gennady P.²,Ieshkin Alexei E.⁵,Mazarov Paul⁶,Suvorov Dmitriy V.²,Fu Dejun³,Pelenovich Vasiliy³,Zeng Xiaomei³,Zuo Wenbin³

Affiliation:

1. Centre for Physics and Technological Research (CeFITec), Dept. de Física da Faculdade de Ciências e Tecnologia (FCT); Universidade Nova de Lisboa; 2829-516 Caparica Portugal

2. Ryazan State Radio Engineering University; Gagarin Str. 59/1 390005 Ryazan Russian Federation

3. Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics, School of Physics and Technology; Wuhan University; 430072 Wuhan China

4. Institute for Physics of Microstructures of the Russian Academy of Sciences (IPM RAS); 603950 Nizhniy Novgorod Russian Federation

5. Faculty of Physics; Lomonosov Moscow State University; Leninskie Gory 119991 Moscow Russian Federation

6. Raith GmbH; Konrad-Adenauer-Allee 8 44263 Dortmund Germany

Funder

Ministry of Education and Science of the Russian Federation

National Natural Science Foundation of China

Russian Foundation for Basic Research

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

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