Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach-Reference-Cited by-同舟云学术

Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach

Author:

Naderi-Gohar Soheila¹²³,Huang Kevin M.H.¹⁴,Wu Yiliang⁵⁶,Lau Woon Ming⁷,Nie Heng-Yong¹²^ORCID

Affiliation:

1. Surface Science Western; The University of Western Ontario; 999 Collip Circle London Ontario N6G 0J3 Canada

2. Department of Physics and Astronomy; The University of Western Ontario; London Ontario N6A 3K7 Canada

3. Advanced Mineral Technology Laboratory; 100 Collip Circle London Ontario N6G 4X8 Canada

4. Amec Foster-Wheeler; 700 University Avenue Toronto Ontario M5G 1X6 Canada

5. Advanced Materials Laboratory; Xerox Research Centre of Canada; Mississauga Ontario L5K 2L1 Canada

6. TE Connectivity; 306 Constitution Drive Menlo Park CA 94025 USA

7. Chengdu Green Energy and Green Manufacturing Technology R&D Center; Chengdu Sichuan 610207 China

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Reference49 articles.

2. Studies of spin-coated polymer films;Norrman;Annu. Rep. Prog. Chem., Sect. C,2005

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