Quantitative evaluation of AES-depth profiles of thin anodic oxide films (Ta2O5/Ta, Nb2O5/Nb)
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference34 articles.
1. Quantitative depth profiling in surface analysis: A review
2. An attempt to understand preferential sputtering
3. Alloy sputtering
4. Auger study of preferred sputtering on binary alloy surfaces
5. The influence of ion sputtering on the elemental analysis of solid surfaces
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