A simple method for removing overlapped Auger signals from ELS or low energy reflection mode EXELFS
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference10 articles.
1. and (Ed.), EXAFS Spectroscopy techniques and applications, Plenum, New York (1981), ch. 17-21, and references therein.
2. Extended ELS fine structures above the M2,3 edges of Cu and Ni
3. Radial distribution functions of Cu and Ni by reflection energy loss spectroscopy
4. Surface extended energy loss fine structures above the K-edge of oxygen on Al
5. Surface Extended Energy-Loss Fine Structures of Oxygen on Ni(100)
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPY;Surface Review and Letters;1995-02
2. Structural surface investigations with low-energy backscattered electrons;Surface Science Reports;1995
3. Extended energy loss fine structure analysis;Critical Reviews in Solid State and Materials Sciences;1989-01
4. Structural characterization of surfaces by extended energy‐loss fine‐structure spectroscopy;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1987-07
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