Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping-Reference-Cited by-同舟云学术

Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping

Published:2020-01-21 Issue:6 Volume:16 Page:1905990
ISSN:1613-6810
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language:en
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Author:

Richard Marie‐Ingrid¹²^ORCID,Cornelius Thomas W.¹,Lauraux Florian¹,Molin Jean‐Baptiste³,Kirchlechner Christoph³,Leake Steven J.²,Carnis Jérôme¹²,Schülli Tobias U.²,Thilly Ludovic⁴,Thomas Olivier¹

Affiliation:

1. Aix Marseille UniversitéCNRSUniversité de Toulon IM2NP UMR 7334 13397 Marseille France

2. ID01/ESRFThe European Synchrotron 71 Avenue des Martyrs Grenoble 38043 Cedex France

3. Max‐Planck‐Institut für Eisenforschung GmbH Max‐Planck‐Strasse 1 40237 Düsseldorf Germany

4. Institut PprimeUPR 3346CNRSUniversity of Poitiers ISAE‐ENSMA, SP2MI, Boulevard Marie et Pierre Curie, BP 30179 86962 Futuroscope Chasseneuil Cedex France

Funder

Agence Nationale de la Recherche

European Research Council

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/smll.201905990

Reference34 articles.

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2. Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy

3. Observing and measuring strain in nanostructures and devices with transmission electron microscopy

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5. The Measurement of Residual Stresses Using Neutron Diffraction

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