Reliability modeling for competing failure processes considering degradation rate variation under cumulative shock
Author:
Affiliation:
1. School of Aeronautic Science and Engineering Beihang University Beijing 100191 China
2. Beijing Institute of Control Engineering Beijing 100094 China
3. China Aerospace Science and Technology Corporation Beijing 100094 China
Publisher
Wiley
Subject
Management Science and Operations Research,Safety, Risk, Reliability and Quality
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/qre.3216
Reference36 articles.
1. Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation
2. An Inspection-Maintenance Model for Systems With Multiple Competing Processes
3. Reliability and maintenance modeling for systems subject to multiple dependent competing failure processes
4. Modeling zoned shock effects on stochastic degradation in dependent failure processes
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