Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy-Reference-Cited by-同舟云学术

Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Published:2016-04-25 Issue:25 Volume:28 Page:5106-5111
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Bose Riya¹,Sun Jingya¹,Khan Jafar I.¹,Shaheen Basamat S.¹,Adhikari Aniruddha¹,Ng Tien Khee²,Burlakov Victor M.³,Parida Manas R.¹,Priante Davide²,Goriely Alain³,Ooi Boon S.²,Bakr Osman M.¹,Mohammed Omar F.¹

Affiliation:

1. Solar and Photovoltaics Engineering Research Center; Division of Physical Sciences and Engineering; King Abdullah University of Science and Technology (KAUST); Thuwal 23955-6900 Kingdom of Saudi Arabia

2. Photonics Laboratory; Computer, Electrical, and Mathematical Sciences and Engineering; KAUST; Thuwal 23955-6900 Kingdom of Saudi Arabia

3. Mathematical Institute; University of Oxford; Woodstock Road Oxford OX2 6GG UK

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/adma.201600202/fullpdf

Reference60 articles.

1. 4D Electron Microscopy: Principles and Applications

2. Four-Dimensional Electron Microscopy

3. Four-dimensional ultrafast electron microscopy