Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination
Author:
Affiliation:
1. Electrical Engineering and Computer Sciences University of California at Berkeley Berkeley CA 94720 USA
2. Materials Sciences Division Lawrence Berkeley National Laboratory Berkeley CA 94720 USA
Funder
National Science Foundation
Office of Science
Basic Energy Sciences
U.S. Department of Energy
Publisher
Wiley
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.201900136
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