Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes-Reference-Cited by-同舟云学术

Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes

Published:2018-06-19 Issue:31 Volume:30 Page:1801773
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Zheng Jianyun¹,Lyu Yanhong¹,Xie Chao¹,Wang Ruilun¹,Tao Li¹,Wu Haibo²,Zhou Huaijuan²,Jiang Sanping³,Wang Shuangyin¹^ORCID

Affiliation:

1. State Key Laboratory of Chem/Bio-Sensing and Chemometrics; College of Chemistry and Chemical Engineering; Hunan University; Changsha 410082 Hunan China

2. State Key Laboratory of High Performance Ceramics and Superfine Microstructure; Shanghai Institute of Ceramics; Chinese Academy of Sciences; Shanghai 200050 China

3. Fuels and Energy Technology Institute and Department of Chemical Engineering; Curtin University; Perth Western Australia 6102 Australia

Funder

National Natural Science Foundation of China

Natural Science Foundation of Hunan Province

Shanghai Sailing Program

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/adma.201801773/fullpdf

Reference29 articles.