Investigation of non-local transport phenomena in small semiconductor devices
Author:
Publisher
Wiley
Subject
Electrical and Electronic Engineering
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/ett.4460010312/fullpdf
Reference17 articles.
1. An efficient technique for two dimensional simulation of velocity overshoot effects in Si and GaAs devices;Cook;COMPEL,1982
2. An investigation of steady-state velocity overshoot in silicon;Baccarani;Solid-State Electron.,1985
3. MOSFET substrate current model including energy transport;Fukuma;IEEE Electron Device Lett.,1987
4. The influence of the thermal equilibrium approximation on the accuracy of classical two-dimensional numerical modeling of silicon submicrometer MOS transistors;Meinerzhagen;IEEE Trans. Electron Devices,1988
5. Hot-electron and hole-emission effects in short n-channel devices;Hofman;IEEE Trans. Electron Devices,1985
Cited by 45 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The Semiconductor Model Solved by the Numerov Process Over a Non-Uniform Grid;2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS);2021-09-01
2. Coupled Electromagnetic and Hydrodynamic Modeling for Semiconductors Using DGTD;IEEE Transactions on Magnetics;2021-06
3. Mathematical Model of Semiconductor Devices;Physics of Semiconductor Devices;2017-09-28
4. Lyapunov FunctionalFunctional for Inertial Approximations;SpringerBriefs in Mathematics;2015
5. Discretization of Semiconductor Device Problems (II);Handbook of Numerical Analysis;2005
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3