Author:
Traversini Renzo,Lisio Aurelio De,Barbuscia Giuseppe
Subject
Electrical and Electronic Engineering
Reference50 articles.
1. VLSI yield prediction and estimation: a unified framework;Maly;IEEE Trans. Computer-Aided Desing,1986
2. Statistical control of VLSI fabrication processes: a framework;Mozumder;IEEE Trans. Seminconductor Manufacturing,1988
3. Statistical control of VLSI fabrication processes: a software system;Shyamsundar;IEEE Trans. Semiconductor Manufacturing,1988
4. W. Maly, S. E. Naik: Process monitoring oriented IC testing. Internal Report, Dept. of Electrical and Computer Engineering, Carnegie-Mellon University, 1989.
5. Modeling of lithography related yield losses for CAD of VLSI circuits;Maly;IEEE Trans. Computer-Aided Design,1985