Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
85 articles.
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1. Study on Paradigm of Variable Length SRAM Embedded Memory Testing;2021 5th International Conference on Electronics, Communication and Aerospace Technology (ICECA);2021-12-02
2. Defect-Oriented Test: Effectiveness in High Volume Manufacturing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-03
3. Lithography-Aware Analog Layout Retargeting;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2016-02
4. A Survey of Yield Modeling and Yield Enhancement Methods;IEEE Transactions on Semiconductor Manufacturing;2013-05
5. Diagnosis of Local Spot Defects in Analog Circuits;IEEE Transactions on Instrumentation and Measurement;2012-10