Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?-Reference-Cited by-同舟云学术

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Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?

Published:2002 Issue:1 Volume:34 Page:276-279
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Mottu N.,Vayer M.,Benoit R.,Erre R.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference14 articles.

1. In Practical Surface Analysis (2nd edn), vol. 2, (eds). John Wiley: Chichester, 1992; 105-143.

2. Sputter Depth Profiling of Thin Films

3. Compositional depth profiling by sputtering

4. Sputter depth profile analysis of interfaces

5. Surface composition changes of Ni-Zr alloy under Ar+ ion bombardment by ISS, AES and XPS

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluation of AES depth profiles with serious artefacts in C/W multilayers;Applied Surface Science;2022-04

2. Influence of low-temperature carburising on metal release from AISI316L austenitic stainless steel in acetic acid;Journal of Food Engineering;2014-09

3. Modelling of grazing incidence X-ray diffraction spectra from Mo-implanted stainless steel;Surface and Coatings Technology;2006-04

4. Structure and composition effects on pitting corrosion resistance of austenitic stainless steel after molybdenum ion implantation;Surface and Coatings Technology;2005-12

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