Thin-Film Deposition Materials
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Publisher
John Wiley & Sons, Inc.
Reference246 articles.
1. Electrical properties of bulk silicon dioxide and SiO2/Si interface, formed by tetraethylorthosilicate-ozone chem. vapor deposition;Kim;J. Electrochem. Soc.,2000
2. Low temperature silicon nitride and silicon dioxide film processing by inductively coupled plasma chemical vapor deposition;Lee;J. Electrochem. Soc.,2000
3. Deposition kinetics of silicon dioxide from tetraethylorthosilicate by PECVD;Kim;Thin Solid Films,2000
4. Deposition kinetics of silicon dioxide from hexamethyldisilazane and oxygen by PECVD;Kim;Thin solid films,1999
5. Improved hydrogen free chemical vapor deposition of silicon dioxide;Uchida;J. Noncryst. Solids,1999
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