Optische in-situ Prozessverfolgung und -steuerung
Author:
Publisher
Wiley
Subject
Surfaces, Coatings and Films,Condensed Matter Physics
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/vipr.201300539/fullpdf
Reference19 articles.
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4. High-speed spectral ellipsometry for in-situ diagnostic and process control;Duncan;J.Vac.Sci.Technol.,1994
5. In-situ optical monitoring of thin film deposition;Netterfield;SPIE,1988
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